Compositional Generation of MC/DC Integration Test Suites
نویسندگان
چکیده
منابع مشابه
Compositional Generation of MC/DC Integration Test Suites
We present a method for automatically generating tests for reactive systems specified by concurrently executing extended finite state machines. The generated test suites satisfy the modified condition/decision coverage criterion at unit and integration levels. The generation of MC/DC suites for eager first-order functional programs is subsumed. An industrial chip card case study illustrates the...
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ژورنال
عنوان ژورنال: Electronic Notes in Theoretical Computer Science
سال: 2003
ISSN: 1571-0661
DOI: 10.1016/s1571-0661(04)81020-x